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1

A closed system fabrication of chromium silicide thin film resistors

Pramod C. Karulkar

Journal:

Thin Solid Films

Year:

1984

Language:

english

File:

PDF, 222 KB

english, 1984

2

Underfill Filler Settling Effect on the Die Backside Interfacial Stresses of Flip Chip Packages

Chen, Cheng-fu, Karulkar, Pramod C.

Journal:

Journal of Electronic Packaging

Year:

2008

Language:

english

File:

PDF, 846 KB

english, 2008

3

A pressure contact current-voltage technique for rapid characterization of thin dielectric films

Pramod C. Karulkar, R.J. Hillard, J.M. Heddleson, P. Rai-Choudhury

Journal:

Applied Surface Science

Year:

1991

Language:

english

File:

PDF, 383 KB

english, 1991

4

ESCA characterization of the oxide tunneling barriers in niobium based superconductive tunnel junctions

Pramod C. Karulkar, James E. Nordman

Journal:

Applications of Surface Science

Year:

1980

Language:

english

File:

PDF, 538 KB

english, 1980

5

Fabrication of Nb-NbOx-Pb Josephson tunnel junctions using rf glow-discharge oxidation

Karulkar, Pramod C.

Journal:

Journal of Applied Physics

Year:

1979

Language:

english

File:

PDF, 980 KB

english, 1979

6

Study of thin Nb oxide films

Karulkar, Pramod C.

Journal:

Journal of Vacuum Science and Technology

Year:

1980

Language:

english

File:

PDF, 849 KB

english, 1980

7

[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Heat Transfer in a Three Dimensional Stacked Chip Scale Package (CSP) Module

Ragunathan, Srivathsan, J.Goering, Douglas, C.Karulkar, Pramod

Year:

2007

Language:

english

File:

PDF, 395 KB

english, 2007

8

Characterization of etching of silicon dioxide and photoresist in a fluorocarbon plasma

Karulkar, Pramod C.

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

1988

Language:

english

File:

PDF, 788 KB

english, 1988

9

Electrical and Optical Properties of V[sub 2]O[sub 5] Micro-Nano Structures Grown by Direct Vapor Phase Deposition Method

Hullavarad, Nilima V., Hullavarad, Shiva S., Karulkar, Pramod C.

Journal:

Journal of The Electrochemical Society

Year:

2008

Language:

english

File:

PDF, 591 KB

english, 2008

10

An improved, low cost die-attachment technique for sapphire dice

Karulkar, Pramod C.

Journal:

Journal of Vacuum Science and Technology

Year:

1982

Language:

english

File:

PDF, 957 KB

english, 1982

11

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Influence of filler settling on the analysis of solder reliability of flip chip packaging

Cheng-fu Chen,, Karulkar, Pramod C.

Year:

2008

Language:

english

File:

PDF, 540 KB

english, 2008

12

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Characterization of drop impact survivability of a 3D CSP stack module

Peterson, Daniel, Cheng-fu Chen,, Karulkar, Pramod C.

Year:

2008

Language:

english

File:

PDF, 688 KB

english, 2008

13

Plasma Etching of Ion Implanted Polysilicon

Karulkar, Pramod C.

Journal:

Journal of The Electrochemical Society

Year:

1989

Language:

english

File:

PDF, 906 KB

english, 1989

14

Radiation Hardening of Simox Buried Oxide by Nitridation

Karulkar, Pramod C., Wyatt, P. W.

Journal:

MRS Proceedings

Year:

1992

Language:

english

File:

PDF, 268 KB

english, 1992

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